Characterization of thermally-damaged LX-17
نویسندگان
چکیده
منابع مشابه
Lamb Wave Propagation in Thermally Damaged Composites
The use of composites in primary and secondary structures of aerospace vehicles is important for increased performance with little weight penalty. Determining the response to thermal damage is necessary for a complete understanding of the total use environment of these materials. The objective of the research presented here is to provide a method of quantifying the amount of thermal damage in c...
متن کاملImaging thermally damaged tissue by Polarization Sensitive Optical Coherence Tomography.
Polarization Sensitive Optical Coherence Tomography (PS- OCT) was used to image the reduction of birefringence in biological tissue due to thermal damage. Through simultaneous detection of the amplitude of signal fringes in orthogonal polarization states formed by interference of light backscattered from turbid media and a mirror in the reference arm of a Michelson interferometer, changes in th...
متن کاملLx = b
Preface The ability to solve a system of linear equations lies at the heart of areas such as optimization, scientific computing and computer science and, traditionally, has been a central topic of research in numerical linear algebra. Consider a system Ax = b with n equations in n variables. Broadly, solvers for such a system of equations fall into two categories. The first is Gaussian eliminat...
متن کاملCharacterization of thermally poled germanosilicate thin films.
We report measurements of the nonlinearity profile of thermally poled low-loss germanosilicate films deposited on fused-silica substrates by PECVD, of interest as potential electro-optic devices. The profiles of films grown and poled under various conditions all exhibit a sharp peak ~0.5 microm beneath the anode surface, followed by a weaker pedestal of approximately constant amplitude down to ...
متن کاملCharacterization of thermally treated PECVD SiON layers
PECVD Silicon Oxynitride (SiON) layers with different refractive indices (1.472-1.635) were grown and characterized. The as-deposited layers have good thickness uniformity (~1%) and a high homogeneity of the refractive index (~ 5x10-4) over the wafer area. For telecommunication application, however, the optical losses of the as-deposited layers are unacceptably high. Therefore, the loss reducti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Thermal Analysis and Calorimetry
سال: 2008
ISSN: 1388-6150,1572-8943
DOI: 10.1007/s10973-007-8869-y